Sungju Park

Contact Points :

Adress : Dept. of Computer Science and Engineering, Hanyang University

Ansan, Kyunggi-Do KOREA 426-791

Office : Multimedia System Lab, 519-1, 3rd Engineering Building   

Telephone : +82-31-408-4723

FAX : +82-31-408-4723

E-mail : paksj@hanyang.ac.kr

Homepage : http://mslab.hanyang.ac.kr/Professor_Park.htm

 

 

 

 

 

Research Interests :

Digital System Design

Communication System Design

VLSI Design Automation

Testing VLSI : Testing and Design for Testability (detecting physical defects)

 

Education :

[3/1976 - 2/1983] B.S., Dept. of Electronics Engineering, Hanyang University

[9/1986 - 9/1988] M.S., Dept. of Electrical and Computer Engineering, University of  Massachusetts

[9/1988 - 5/1992] Ph.D., Dept. of Electrical and Computer Engineering, University of Massachusetts

Ph.D Thesis : "An Investigation of Techniques for Partial Scan and Parity Testable BIST Design"

Ph.D. Advising Professor : Sheldon B. Akers

 

Experience :

[2/1983 - 8/1986]  Research and Development Engineer, Gold Star(now, LG)

[8/1986 - 5/1992]  Research Assistant, University of Massachusetts

[5/1992 - 8/1992]  Research Prof., University of Massachusetts

[9/1992 - 2/1995]  Research Staff, IBM Research Center(N.Y. U.S.A)

[3/1995 - 2/2005]  Assistant Prof., Dept. of Computer Science and Engineering, Hanyang University

[3/2005 - present]  Professor, Dept. of Computer Science and Engineering, Hanyang University

 

Honors and Awards :

Best paper award (2011 Korea Test Conference)

Best Engineering Science Teacher Award (2008 Hanyang Univ.)

Award for Excellent Paper (2007 Korea Test Conference)

Award for Excellent Lecture Material(2007 IDEC)

Distinguishd Service Medal (2006 Korea Test Association)

Award for Development of Excellent Education Material(2005 IDEC)

Korean Test Conference Program Chair (2003-2004)

Techical Committee of International Conferences

Outstanding Research Professor Award (1999 Hanyang Univ.)

 

Activities and Services :

[29/6/1995] Design For Testability Seminar at Samsung Electronics

[24/7/1995] Design For Testability Seminar at Hyundai Semiconductor

[27/7/1995] Design For Testability Seminar at LG Electronics

[9/8/1995] Design For Testability Seminar at KT

[10/8/1995] Design For Testability Seminar at ETRI

[29/5/1996] Design For Testability Lecture at IDEC KAIST Univ.

[5/6/1996] Paper Presentation at Design Automation Conference(Las Vegas, USA)

[29/6/1996] Session Chair at Summer KISS Conference   

[26/10/1996] Session Chair at Autumn KISS Conference

[28/5/1997] Design For Testability Lecture at IDEC KAIST Univ.

[25/10/1997] Session Chair at Autumn KISS Conference

[5/1998] Digital Testing Lecture at IDEC Hanyang Univ.

[7/1998] Testing Lecture at IDEC Chonnam Univ.

[9/1998] Testing Lecture at IDEC Pusan Univ.

[8/11/1998] Session Chair at Autumn KISS Conference

[8/1999] Editorial Staff of KISS Paper

[9/1999] Digital Testing Lecture at IDEC Hanyang Univ.

[11/1999] Testing Seminar at Hyundai Semiconductor

[12/1999] Testing Lecture at IDEC Kwangwoon Univ.

[1/1999 - 12/2000] Editorial Staff of KISS Paper

[5/2000]  UART Lecture at IDEC Hanyang Univ.

[7/2000]  SoC Workshop Program Chair at IDEC Hanyang Univ.

[7/2000]  Digital Testing Lecture at IDEC Hanyang Univ.

[5/2002]  Korea Test Conference Program Committee

[1/2003]  Digital Testing Lecture at IDEC Hanyang Univ.

[2/2003]  Digital System Design Lecture at IDEC Hanyang Univ.

[6/2003]  Korea Test Conference Program Chair

[6/2003]  Seminar at Samsung Semiconductor

[1/2004]  Digital Testing Lecture at IDEC Hanyang Univ.

[2/2004]  Digital System Design Lecture at IDEC Hanyang Univ.

[6/2004]  Paper Presentation at Design Automation Conference U.S.A.

[6/2004]  Korea Test Conference Program Chair  

[11/2004] IT-SoC Center : Mixed Signal Test Methodology

[3/2005]  DongBu-Anam Semiconductor (BuCheon) SoC Scan Test Techniques

[4/2005]  DongBu-Anam Semiconductor (SangWoo) SoC Scan & JTAG Test Techniques

[5/2005]  SoC Workshop Program Chair at Yonsei Univ.

[1/2006] SoC Design & Testing Lecture at IDEC Hanyang Univ.

[5/2006] Attended IEEE VLSI Test Symposium (Berkeley CA, U.S.A.)

[5/2006] Seminar in Univ. of  Massachusetts at Amherst (Amherst MA, U.S.A.)

[6/2006] A committee of arrangements at Korea Test Conference Program (a chairman of finances subcommittee)

[7/2006] Attended Design Automation Conference (San Francisco CA, U.S.A.)

[10/2006] Paper Presentation at International Test Conference (SanJose CA, U.S.A.)

[11/2008] Manager, Regional Center of Semiconductor Design Institute, IDEC, Hanyang Univ.

[1/2009-2/2011] Center chair for the IDEC at Hanyang Univ.

[6/2012] Seminar for SoC testing at KETI

[8/2012] Seminar for Automobile SoC testing at IDEC lecture

[10/2012] Visit the TSE for technical discussions

[10/2012] Speech at the 2012 Korea Test Workshop

[11/2012] Visit the Advantest Korea for technical discussions

[12/2012] Visit the Teradyne for technical discussions

[1/2013] Speech at the SEMICON Korea 2013 for Automobile reliability

[3/2013] Seminar for Automobile SoC diagnosis at ETRI

[3/2013] Technical discussions with Advantest, Samsung, Teradyne

 

My lovely Students :

If you would like more information about research, publication, teaching and professional activities, click on the above image or the hyper link of my office, Multimedia System Lab.